Title:
SYSTEM AND METHOD FOR PHASE MEASUREMENT
Document Type and Number:
Japanese Patent JP2013152243
Kind Code:
A
Abstract:
To provide a system for phase measurement for dealing with the problem of phase noise.
A system for phase measurement includes systems based on a principle of interferometer inspection and/or phase measurement, and is used for studying cell physiology. The system includes a principle of LCI (low-coherence interferometer inspection) using an optical interferometer for measuring a phase or LSS (light scattering spectroscopy) using interference in a cell part itself, or alternatively, is combined with the principles of LCI and LSS.
Inventors:
CHRISTOPHER M FANG-YEN
GABRIEL POPESCU
YANG CHANGHUEI
ADAM P WAX
RAMACHANDRA R DASARI
FELD MICHAEL S
GABRIEL POPESCU
YANG CHANGHUEI
ADAM P WAX
RAMACHANDRA R DASARI
FELD MICHAEL S
Application Number:
JP2013077045A
Publication Date:
August 08, 2013
Filing Date:
April 02, 2013
Export Citation:
Assignee:
MASSACHUSETTS INST TECHNOLOGY
International Classes:
G01N21/17
Domestic Patent References:
| JP2003121749A | 2003-04-23 |
Attorney, Agent or Firm:
Patent business corporation Odashima patent office