PURPOSE: To provide a temperature abnormality detection circuit for semiconductor integrated circuit devices which can easily detect the temperature abnormality of a semiconductor integrated circuit device and with which the temperature can be set with high accuracy.
CONSTITUTION: The detection circuit is formed on the semiconductor chip of a semiconductor integrated circuit device, detects the abnormal temperature rise of the semiconductor chip, and outputs a temperature abnormality signal when the circuit detects an abnormal temperature. In addition, the detection circuit is constituted of a temperature detection circuit 11 which outputs the temperature state of the semiconductor chip, temperature setting circuit 12 which is set in its designing and manufacturing states, comparator circuit 13 which compares the outputs of the circuits 11 and 12 with each other, and correction circuit which corrects the accuracy of the detection circuit when the accuracy drops. When the temperature detected by means of the circuit 11 exceeds a set value, the output difference between the circuits 11 and 12 becomes larger due to a difference in changing factor between the outputs of the circuits 11 and 12 caused by the temperature change and the circuit 13 outputs an interrupt signal for the temperature abnormality signal.
| JP2001242016 | ELECTRONIC CLINICAL THERMOMETER |
| JP4260843 | Device and how to manufacture it |
KOBAYASHI KOJI
NISHIKAWA HIDEKI
HITACHI MICOM SYST KK