Title:
温度試験装置及び温度試験方法
Document Type and Number:
Japanese Patent JP7348218
Kind Code:
B2
Abstract:
The temperature test apparatus includes an OTA chamber 50 as an anechoic box, a heat insulating housing that is accommodated in the OTA chamber, a temperature control device that controls a temperature in the heat insulating housing, a ventilation block 210 that is made of metal and provided to block an opening 502 formed in the OTA chamber, and in which a plurality of through-holes 214 are formed, a first cover 220 that is provided on an outer side of the OTA chamber to cover the ventilation block, and form a first space 225 with the ventilation block, and is joined to a pipe for air from the temperature control device, and a second cover 250 that is provided on an inner side of the OTA chamber to cover the ventilation block, and form a second space 255 communicating with the heat insulating housing, together with the ventilation block.
Inventors:
Tomoki Morita
Application Number:
JP2021017546A
Publication Date:
September 20, 2023
Filing Date:
February 05, 2021
Export Citation:
Assignee:
Anritsu Corporation
International Classes:
G01R29/10; H05K9/00
Domestic Patent References:
| JP2005347524A | ||||
| JP2007173280A | ||||
| JP2007101445A | ||||
| JP63108694U | ||||
| JP2006284113A | ||||
| JP200374927A | ||||
| JP518617U | ||||
| JP1241899A | ||||
| JP2008166474A | ||||
| JP6334380A | ||||
| JP8186394A | ||||
| JP7136829B2 |
Foreign References:
| US20190056439 | ||||
| US20200025822 | ||||
| US20140140001 |
Attorney, Agent or Firm:
Ariga International Patent Office
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