Title:
温度閾値決定装置、温度異常判定システム、温度閾値決定方法、およびプログラム
Document Type and Number:
Japanese Patent JP7070339
Kind Code:
B2
Abstract:
Provided is a temperature threshold determining device that can determine an appropriate temperature threshold even when a target apparatus does not operate normally during a test operation performed on the target apparatus to determine the temperature threshold. The temperature threshold determining device inside a temperature abnormality determining device (30) includes a temperature data storage unit (35), a representative temperature value determining unit (37a), and a temperature threshold determining unit (37b). The temperature data storage unit (35) stores temperature data that indicates the temperature of a target apparatus (10) during past operation. The representative temperature value determining unit (37a) determines a representative temperature value (Trep) of the target apparatus (10) during the past operation, which is derived using the temperature data stored in the temperature data storage unit (35). The temperature threshold determining unit (37b) determines at least one temperature threshold (Tth) by using the representative temperature value (Trep) during the past operation and a reference temperature value (Tref) that is preset and configured to prevent the temperature abnormality.
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Inventors:
Akihiro Nakamura
Ryo Ikeuchi
Kenta Kozono
Takaaki Yamada
Ryo Ikeuchi
Kenta Kozono
Takaaki Yamada
Application Number:
JP2018205486A
Publication Date:
May 18, 2022
Filing Date:
October 31, 2018
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G05B23/02
Domestic Patent References:
| JP2006295413A | ||||
| JP2003172567A |
Attorney, Agent or Firm:
Takuji Yamada
Yukinori Nakakura
Yukinori Nakakura