PURPOSE: To provide a test fixture which is accompanied by small current loop and excellent reproducibility and which allows measurement without affected by the number of terminals of a DUT and terminal positions.

CONSTITUTION: A conductive block 1a is placed near a DUT pedestal 2, and a probe 3a provided on the block 3a is made to contact the terminal of a DUT 6. The DUT 6 is pressed toward the side of a conductive black 1b by the contact probe 3a on the conductive block 1a, so that the terminal of DUT 6 connects to the contact probes 3a and 3b provided on the blocks 1a and 1b. The electric connection between the DUT pedestal 2 and the conductive blocks 1a and 1b, configured separately from the pedestal, is established using a conductive rubber 7, so the ground current flows between the conductive blacks 1a and 1b through the DUT pedestal 2. In addition, by placing the conductive rubber 7 near the top surface of the DUT pedestal 2, the effect of remaining inductance between the conductive blocks 1a and 1b can be minimized.