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Title:
TEST SYSTEM FOR FAULT CONTACT DETECTING FUNCTION OF SUBSCRIBER CIRCUIT
Document Type and Number:
Japanese Patent JPH0530170
Kind Code:
A
Abstract:

PURPOSE: To shorten the test of a fault contact detecting function within one cycle in a call signal by effectively using the existing constitution elements while excluding the increase of constitution elements.

CONSTITUTION: A call signal impressing circuit 8 which opens a DC voltage supply device 1-side and which selectively impresses the call signal overlapped with DC voltage on a DC voltage supply line and a ground potential supply line is provided for a subscriber circuit having opening/closing elements for terminal equipment detachment 4 and 5, the DV voltage supply line 2, the ground potential supply line 3, a fault contact supervisory voltage extraction circuit 6 and a short detection circuit 7. The call signal overlapped with DC voltage is selectively supplied to the DC voltage supply line or the ground potential supply line from the call signal impressing circuit 8 in a state where the opening/closing elements for terminal equipment detachment 4 and 5 are opened and the DC voltage supply device 1-side is opened.


Inventors:
SHIBUYA KIYOSHI
Application Number:
JP18256291A
Publication Date:
February 05, 1993
Filing Date:
July 23, 1991
Export Citation:
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Assignee:
FUJITSU LTD
FUJITSU COMMUNICATION SYST
International Classes:
H04M1/24; (IPC1-7): H04M1/24
Attorney, Agent or Firm:
Furuya



 
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