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Patent Searching and Data


Title:
TESTING DEVICE FOR TEMPERATURE
Document Type and Number:
Japanese Patent JPS5821175
Kind Code:
A
Abstract:

PURPOSE: To perform high temp./low temp. cycle tests automatically under programmed control and to improve the efficiency of the testing operations by setting the environmental conditions for testing the temp. of printed board units in a control section.

CONSTITUTION: A function tester 1 for testing the functions of a printed board unit 23 wherein electronic parts, etc. are packaged on a printed board is provided with a thermal box 7 for covering the unit 23, a heat chamber 4 having a duct 4a for feeding of hot wind into the box 7, a cold chamber 5 having ducts 5aW5c for circulating cold wind in the box 7, and a control section 8 for controlling the chambers 4 and 5 selectively. The temp. of atmosphere in the box 7 is controlled to a required temp. by the selection of the chambers 4 and 5, whereby the unit 23 is tested.


Inventors:
KAWAI SHIGERU
Application Number:
JP11970581A
Publication Date:
February 07, 1983
Filing Date:
July 30, 1981
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G01N17/00; G01R31/28; G01R31/30; (IPC1-7): G01N17/00; G01R31/30
Domestic Patent References:
JP53073457B
Attorney, Agent or Firm:
Koshiro Matsuoka