Title:
Time-of-flight drift correction with time-of-flight mass spectrometer
Document Type and Number:
Japanese Patent JP6310431
Kind Code:
B2
Abstract:
A method of correcting time-of-flight drift in a mass spectrometer by identifying mass spectral peaks of ions in spectra, detecting ions having substantially the same mass across spectra, determining a time-of-flight drift of the detected ions, and correcting the time-of-flight drift of the detected ions by applying a correction factor to each respective time-of-flight.
Inventors:
Jaroshinski, Jonathan
Willis, Peter Markel
Willis, Peter Markel
Application Number:
JP2015196432A
Publication Date:
April 11, 2018
Filing Date:
October 02, 2015
Export Citation:
Assignee:
LECO CORPORATION
International Classes:
G01N27/62; H01J49/00; H01J49/40
Domestic Patent References:
| JP2008070122A | ||||
| JP9080022A | ||||
| JP2004317509A | ||||
| JP2010073331A | ||||
| JP2001500606A | ||||
| JP2005302622A |
Foreign References:
| WO2008059567A1 | ||||
| WO2008146440A1 | ||||
| WO2009081444A1 | ||||
| US20060095212 | ||||
| US20080243407 |
Attorney, Agent or Firm:
Shinjiro Ono
Yasushi Kobayashi
Shigeo Takeuchi
Osamu Yamamoto
Wataru Kitakita
Yasushi Kobayashi
Shigeo Takeuchi
Osamu Yamamoto
Wataru Kitakita