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Patent Searching and Data


Title:
【発明の名称】光学的パターン認識分類方法
Document Type and Number:
Japanese Patent JP2834894
Kind Code:
B2
Abstract:
PURPOSE:To discriminate and classify many checked patterns just with display of a small number of reference patterns by deciding an optimum combination of sets of reference patterns. CONSTITUTION:The optical systems 1-5 detect the correlative degrees between the patterns to be recognized and sorted and a reference pattern. Then a computer 51 produces a membership function corresponding to the reference pattern based on each correlative degree between those patterns to be recognized and the reference pattern. Then the unknown images are recognized and sorted with collation carried out between the membership function and the patterns. Then the next operation is carried out with a set of a small number of reference patterns. In other words, the number of areas where the overlapping areas of the membership functions of the patterns to be recognized and sorted are larger than the prescribed value are calculated. Then the reference patterns are successively added at and after the smallest calculated number. Thus a set of reference patterns is obtained.

Inventors:
Toshiharu Takei
Yasuhiro Takemura
Hideki Yamazaki
Application Number:
JP4151691A
Publication Date:
December 14, 1998
Filing Date:
March 07, 1991
Export Citation:
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Assignee:
Sumitomo Osaka Cement Co., Ltd.
Seiko Instruments Co., Ltd.
International Classes:
G03H1/16; G06F7/60; G06T7/00; G02F3/00; (IPC1-7): G06F7/60; G02F3/00; G03H1/16; G06T7/00
Attorney, Agent or Firm:
Kuramochi Yu