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Patent Searching and Data


Title:
ACCESSORIES FOR MICROMETER AND CALLIPERS
Document Type and Number:
Japanese Patent JPH085303
Kind Code:
A
Abstract:

PURPOSE: To provide selectability and changeability of the position and size of a measuring range by furnishing extension standard gauge(s) on the anvil and/or spindle of a micrometer.

CONSTITUTION: A component part to be measured is set between the surface 16 of an anvil 14 and the measuring surface 22 of a spindle 20. These surfaces 16, 22 are approached to the component part by rotating a thimble 18, and its reference position with respect to the body 24 of a micrometer gives a measuring value. The spindle 20 has a measuring range (a), and if the dimension to be measured lies within the range between a+b+c and b+c, it is possible to use the micrometer 10 with no help of any accessory component. If however the measuring range is between (c) and a+c, an extension standard gauge 30 is attached to the spindle 20 with the aid of a sleeve 40, which causes the measuring range to be between (c) and a+c. An appropriate one of the standard gauges 26, 28, 30 is applied to the sleeve 40 for constituting the measuring gap having different length.


Inventors:
RAFUAIRU ENU BABICHIENKO
Application Number:
JP13753994A
Publication Date:
January 12, 1996
Filing Date:
June 20, 1994
Export Citation:
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Assignee:
RAFUAIRU ENU BABICHIENKO
International Classes:
G01B3/18; G01B3/20; (IPC1-7): G01B3/18; G01B3/20
Attorney, Agent or Firm:
Kazuo Sato (3 others)