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Patent Searching and Data


Title:
DEFECT INSPECTION DEVICE
Document Type and Number:
Japanese Patent JPH0611458
Kind Code:
A
Abstract:

PURPOSE: To allow judging that the applicable one belongs to one defect on the real time basis even in case part of the defect forms a neck, the density in reading is low, or the defect extends aslant.

CONSTITUTION: The image of an object to be inspected due to photographing with a line CCD camera 1 is converted into binary values by a comparator 4, and the width of an applicable defect is encoded by a run length encoder circuit 5. A CPU 15 expands the defect and classifies the condition of defect by subjecting the run length code to a coupling property processing over a plurality of continuing scanning lines, and on the basis of the defect date classified, judgement is passed whether the phenomena on the object belong to one defect.


Inventors:
SAITO NORIAKI
FUSE MASAKI
Application Number:
JP19160292A
Publication Date:
January 21, 1994
Filing Date:
June 25, 1992
Export Citation:
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Assignee:
MITSUBISHI RAYON CO
International Classes:
D06H3/08; G01N21/88; G01N21/89; G01N21/892; G06T1/00; G06T5/30; G06T7/60; (IPC1-7): G01N21/89; D06H3/08; G01N21/88; G06F15/62; G06F15/66
Domestic Patent References:
JPS61245045A1986-10-31
JPS6484147A1989-03-29
JPS60103487A1985-06-07
JPH0367159A1991-03-22
Attorney, Agent or Firm:
Nihei Masataka