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Patent Searching and Data


Title:
POLYCRYSTAL THIN FILM OF SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
Document Type and Number:
Japanese Patent JPH0817730
Kind Code:
A
Abstract:

PURPOSE: To obtain a polycrystal thin film whose solid growth time is shortened at a low temperature by a method wherein an insulating layer and a first thin film as well as the first thin film whose generation density of a crystal nucleus is high as compared with that of a second thin film and the second thin film are formed respectively in such a way that their interfaces come into contact with each other and the first thin film and the second thin film are changed into polycrystal films from amorphous films.

CONSTITUTION: An amorphous thin film 2 is formed on a glass substrate 1 as an insulating layer, and an amorphous thin film 3 is formed on the amorphous thin film 2. The amorphous thin film 2 and the amorphous thin film 3 are composed of the same amorphous material. In addition, film-formation conditions such as the deposition temperature, the film-formation pressure and the like of the amorphous thin film 2 are controlled in such a way that the generation density of a crystal nucleus becomes high as compared with that of the amorphous thin film 3. When the amorphous thin film 2 and the amorphous thin film 3 are amorphous silicon films, they are changed into polycrystal films so as to become polycrystal silicon films.


Inventors:
NAKATANI YOSHIKI
TANAKA ATSUSHI
FUJIWARA MASAHIRO
ONO EIZO
Application Number:
JP15117094A
Publication Date:
January 19, 1996
Filing Date:
July 01, 1994
Export Citation:
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Assignee:
SHARP KK
International Classes:
H01L21/205; H01L21/20; H01L21/336; H01L29/78; H01L29/786; (IPC1-7): H01L21/20; H01L21/205; H01L21/336; H01L29/786
Attorney, Agent or Firm:
Shusaku Yamamoto