Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
ELECTRON MICROSCOPE CONTAINING IMAGING LENS SYSTEM AS ENERGY ANALYZER
Document Type and Number:
Japanese Patent JPS5825044
Kind Code:
A
Abstract:

PURPOSE: To realize an energy filter image by use of a simple means by providing a deflecting means out of the axis of an intermediate lens having a large non-axial color aberration so that electron rays pass the deflection means after passing through a limiting diaphragm, and inserting an energy selecting diaphragm into the surface upon which the diffracted image of the intermediate lens is formed.

CONSTITUTION: Electron rays 2, after being transmitted by a film sample 1, are imaged as an electron-ray image 8 upon a fluorescent plate 7 by means an objective lens 3, an intermediate lens 4, and a first and a second projection lenses 5 and 6. Here, when a limiting visual-field diaphragm is inserted on the optical axis, into the position of the image surface of the lens 3, since the shadow of the diaphragm appears around the central part of a linear image formed upon the plate 7, the sample 1 is moved within a surface which is vertical to the optical axis so that an image 8a of the observed sample area is obtained in the center of the plate 7. In addition, an energy selecting diaphragm 16 is inserted into a surface 15 upon which an image diffracted by the lens 4 is formed, and the positional adjustment of the diaphragm 16 is performed so that only a specific peak among the energy spectrum displayed on the plate 7 is displayed.


Inventors:
OIKAWA TETSUO
Application Number:
JP12050981A
Publication Date:
February 15, 1983
Filing Date:
July 31, 1981
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NIPPON ELECTRON OPTICS LAB
International Classes:
H01J37/05; H01J37/26; H01J49/44; (IPC1-7): H01J37/26; H01J49/44