Title:
ULTRASONIC FLAW DETECTING DEVICE AND METHOD
Document Type and Number:
Japanese Patent JP3541922
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To obtain an ultrasonic flaw detecting device and method capable of simply classifying flaws in a specimen without pendular scanning or oscillating scanning only by a flaw detection diaphragm in an A-scope display.
SOLUTION: An ultrasonic flaw detecting device is provided with a flaw detector to output a transmission signal, a probe 1 to radiate ultrasonic pulses diagonally to the surface of a specimen whose flaw is to be detected on the basis of the transmission signal and to receive scattered waves scattered by an acoustically discontinuous part in the specimen as echoes, and a display 5 to display the echoes. The ultrasonic flaw detecting device is provided with a classifying device 50 to classify the properties of the acoustically discontinuous part through the use of the A-scope of the flaw detection diagram of a plurality of echoes propagated through a plurality of propagation paths and received. In this case, it is possible to classify flaws in the specimen simply, to shorten inspection time, and reduce inspection cost.
Inventors:
Tomonori Kimura
Shunpei Kameyama
Shuzo Waka
Yuichi Mame
Mitsuhiro Koike
Shunpei Kameyama
Shuzo Waka
Yuichi Mame
Mitsuhiro Koike
Application Number:
JP6306798A
Publication Date:
July 14, 2004
Filing Date:
March 13, 1998
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
G01N29/04; (IPC1-7): G01N29/04
Domestic Patent References:
| JP59046553A | ||||
| JP5332998A | ||||
| JP49040790A |
Attorney, Agent or Firm:
Michiteru Soga
Yoshio Kobayashi
Yutaka Ikeya
Hidetoshi Furukawa
Suzuki Kenchi
Masahisa Hase
Tetsuo Kuroiwa
Yoshio Kobayashi
Yutaka Ikeya
Hidetoshi Furukawa
Suzuki Kenchi
Masahisa Hase
Tetsuo Kuroiwa
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