Title:
超音波測定方法及び装置
Document Type and Number:
Japanese Patent JP5154422
Kind Code:
B2
Abstract:
In a comparison between master data created from a waveform signal of an observed object of an acceptable article and a waveform signal obtained from a non-measured observed object, time phase difference generated in the observed object is corrected, and difference with the master data is detected. As a first stage, quality determination is performed on the non-measured observed object with a long interval master data using the created master data, and the time phase difference is corrected. Then, as a second stage, quality determination is performed with the short interval master data divided on a time axis and the similarly divided waveform signal of the observed object. The time phase difference generated between the observed objects (acceptable article and defective article) is thereby corrected, and quality determination of high accuracy can be performed from the comparison with the waveform signal of the acceptable article.
Inventors:
Shinsuke Komatsu
Youichiro Ueda
Youichiro Ueda
Application Number:
JP2008531477A
Publication Date:
February 27, 2013
Filing Date:
March 26, 2008
Export Citation:
Assignee:
Panasonic Corporation
International Classes:
G01N29/44; G01N29/04
Domestic Patent References:
| JPS63241351A | 1988-10-06 | |||
| JP2001272339A | 2001-10-05 | |||
| JPH07303640A | 1995-11-21 | |||
| JPH07280542A | 1995-10-27 |
Attorney, Agent or Firm:
Takuji Yamada
Mitsuo Tanaka
Mitsuo Wada
Mitsuo Tanaka
Mitsuo Wada