To provide an inspection device and method thereof, which can enhance a unevenness area, depending on a background of imaging data and a shape and size of unevenness, and stably accurately perform an unevenness inspection.
A first area pattern extraction part 58 sequentially extracts the image brightness data of a center area prescribed by a first area pattern from the upper left of two dimensional image data, and computes a center area average brightness value that is the average of a brightness value of the extracted image brightness data. Also, a second area pattern extracting part 59 for sequentially extracts the image brightness data of a peripheral area prescribed by a second area pattern from the upper left of two dimensional image data, and computes a peripheral area average brightness value that is an average of a brightness value of the extracted image brightness data. A difference computation part 60 computes the difference value between the center area average brightness value and the peripheral area average brightness value, and creates image data enhanced in the unevenness.
NAGAO MASAHIKO
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