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Patent Searching and Data


Title:
WAFER POLISHING DEVICE AND DRESSING METHOD FOR POLISHING SURFACE
Document Type and Number:
Japanese Patent JPH07299731
Kind Code:
A
Abstract:

PURPOSE: To provide a wafer polishing device and a method for dressing a polishing surface, with which dull of a polish cloth and surface unevenness are removed certainly and the quality of wafer is enhanced.

CONSTITUTION: The method includes a separating means 4 to separate a head 2 from the grinding surface 5a and a dressing pad 21 to be put in pressure contact with the grinding surface 5a when the head 2 is separated from the surface 5a, and thereby the grinding of wafer and the dressing works are conducted independently, and the ground surface of the wafer is prevented from ill affection of the falling objects such as abrasive grains off from the dressing pad 21 owing the dressing works.


Inventors:
TAKEDA KEISUKE
SHIRAI KEIICHI
Application Number:
JP9777794A
Publication Date:
November 14, 1995
Filing Date:
May 11, 1994
Export Citation:
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Assignee:
MITSUBISHI MATERIALS CORP
International Classes:
B24B53/007; B24B53/017; H01L21/304; (IPC1-7): B24B37/00; H01L21/304
Attorney, Agent or Firm:
Masatake Shiga (2 outside)