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Title:
WAFER RETAINING MECHANISM
Document Type and Number:
Japanese Patent JPH04184912
Kind Code:
A
Abstract:

PURPOSE: To prevent the temperature change of a wafer without generating vibration in a wafer, and improve position precision, by making a temperature adjusting part and a wafer sucking part independent, and making vibration hard to propagate.

CONSTITUTION: A heat dissipating fin 117 installed on a wafer chuck 107 and a heat absorbing fin 114 installed on a temperature adjusting part 306 are arranged so as to have a fine gap 304. A plurality of air intake vents 301 are formed on the wafer sucking surface side of a chuck 107. Each of the intake vents 301 is connected with a vacuum pump via suction piping 302 buried in the chuck 107, thereby retaining the wafer 109 on the suction surface of the chuck 107. By circulating liquid kept at a constant temperature via piping 303 for temperature adjustment, the temperature of an adjustment part 306 can be kept constant.


Inventors:
HARUMI KAZUYUKI
Application Number:
JP31276990A
Publication Date:
July 01, 1992
Filing Date:
November 20, 1990
Export Citation:
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Assignee:
CANON KK
International Classes:
G03F7/20; H01L21/027; H01L21/683; (IPC1-7): G03F7/20; H01L21/027; H01L21/68
Attorney, Agent or Firm:
Tadashi Wakabayashi (1 person outside)



 
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