電気機器の巻線診断システム

Japanese Patent JP5721548

B2

PROBLEM TO BE SOLVED: To not only determine the quality of a coil but also to enable the quantitative diagnosis of a coil having the high dangerousness of short circuit because of the progress of insulation degradation between coils.SOLUTION: A representative point of a feature amount during a normal state of a coil is calculated on the basis of voltage of both ends of the coil when impulse voltage is applied to the coil in the normal state, the feature amount during short circuit and a representative point of a feature amount during insulation degradation are calculated on the basis of voltage when the impulse voltage is applied to the coil in a state where short circuit and insulation degradation are simulated, a short circuit occurrence probability representing the degree of risk is determined to the representative point of the feature amount during insulation degradation, a standard deviation is determined on the basis of the short circuit occurrence probability during coil insulation degradation, and the representative point of the feature amount at that time and the representative point of the feature amount during the normal state of the coil. In a diagnosis process for diagnosing a diagnosis object coil, a probability value is derived by using a feature amount of the diagnosis object coil based on voltage when the impulse voltage is applied to the diagnosis object coil, the representative point of the feature amount during the normal state of the coil and the standard deviation, and whether the diagnosis object coil is normal and whether insulation degradation progresses are diagnosed from the probability value.

Nakamura Hisae

JP2011129609A

May 20, 2015

May 24, 2011

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Toenec Co., Ltd.

G01R31/02; G01R31/12; G01R31/34

JP2010185861A
JP2008286611A
JP2006250818A

Masatoshi Fukuyama
Yoshihisa Shimizu

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