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Title:
X-RAY FLUORESCENCE PLATING THICKNESS GAUGE WITH FINE POSITIONING MECHANISM FOR SAMPLE
Document Type and Number:
Japanese Patent JPS61148311
Kind Code:
A
Abstract:

PURPOSE: To position a sample automatically, by calculating deviation between a specified measuring image position and a sample image presently an electrically operated XY table based on feature quantity of a binary pattern to move the electrically operated XY table so that a sample will come to a specified measuring image position.

CONSTITUTION: This apparatus is provided with a TV camera 1 for converting a sample into an image, a circuit 2 for binary coding an image, an arithmetic control section 3 adapted to calculate the feature quantity of a binary pattern to control the apparatus and an electrically operated XY table 4 for positioning samples. To position a sample, first, deviation is calculated between a specified measuring image position and sample image presently on the table 4 based on the feature quantity of a binary pattern of the sample to move the table 4 automatically so that the sample will come to the specified measuring image position. thus, when samples of the same shape previously arranged on the table 4 are measured, any deviation can be corrected automatically regardless of errors in the interval of the samples thereby assuring accurate measurement.


Inventors:
TASHIRO HIROMI
Application Number:
JP27035984A
Publication Date:
July 07, 1986
Filing Date:
December 21, 1984
Export Citation:
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Assignee:
SEIKO INSTR & ELECTRONICS
International Classes:
G01B15/00; G01B15/02; G01N23/223; (IPC1-7): G01B15/02
Domestic Patent References:
JPS5977347A1984-05-02
Attorney, Agent or Firm:
Keinosuke Hayashi



 
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