Title:
蛍光X線分光システム及び蛍光X線分光方法
Document Type and Number:
Japanese Patent JP5489401
Kind Code:
B2
Abstract:
X-ray fluorescence (XRF) spectroscopy systems and methods are provided. One system includes a source of x-ray radiation and an excitation optic disposed between the x-ray radiation source and the sample for collecting x-ray radiation from the source and focusing the x-ray radiation to a focal point on the sample to incite at least one analyte in the sample to fluoresce. The system further includes an x-ray fluorescence detector and a collection optic comprising a doubly curved diffracting optic disposed between the sample and the x-ray fluorescence detector for collecting x-ray fluorescence from the focal point on the sample and focusing the fluorescent x-rays towards the x-ray fluorescence detector.
Inventors:
Tseou Chen
David M. Gibson
David M. Gibson
Application Number:
JP2007271638A
Publication Date:
May 14, 2014
Filing Date:
October 18, 2007
Export Citation:
Assignee:
X-Ray Optical Systems Incorporated
International Classes:
G01N23/223; G01T1/36; G21K1/00; G21K1/06; G21K4/00
Domestic Patent References:
| JP7280750A | ||||
| JP1141343A | ||||
| JP11133190A | ||||
| JP7270288A | ||||
| JP10227749A | ||||
| JP2000155102A | ||||
| JP4190148A | ||||
| JP2001124711A | ||||
| JP6072850B2 | ||||
| JP3090471B2 |
Other References:
Z.W. Chen 他,“Microanalysis by monochromatic microprobe x-ray fluorescence - physical basis, properties, and fut,Journal of Applied Physics,1998年 7月15日,Vol. 84, Issue 2,pp.1064-1073
Z.W. Chen 他,“Microprobe x-ray fluorescence with the use of point-focusing diffractors”,Applied Physics Letters,1997年 9月29日,Vol.71, Issue 13,pp.1884-1886
Z.W. Chen 他,“Microprobe x-ray fluorescence with the use of point-focusing diffractors”,Applied Physics Letters,1997年 9月29日,Vol.71, Issue 13,pp.1884-1886
Attorney, Agent or Firm:
Patent Business Corporation Tani/Abe Patent Office
Atsuhiro Hamanaka
Kubota Ikudai
Atsuhiro Hamanaka
Kubota Ikudai