Title:
Ｘ線位相イメージング装置
Document Type and Number:
Japanese Patent JP7147346
Kind Code:
B2
Abstract:
To provide an X-ray phase imaging device capable of suppressing a decrease in image quality of a phase contrast image because of relative position deviation of plural lattices.SOLUTION: In an X-ray phase imaging device 100, a second vibration absorption member 32 for absorbing vibration transmitted to a first lattice G1 and a second lattice G2 is provided in a lattice/detector supporting member 22 for supporting the first lattice G1 and the second lattice G2. An X-ray tube supporting member 21 for supporting an X-ray tube 11 is provided separately from the lattice/detector supporting member 22, and a first vibration absorption member 31 for absorbing vibration of the X-ray tube 11 is provided in the X-ray tube supporting member 21.SELECTED DRAWING: Figure 3
Inventors:
Horiba Hiagari
Tokuda Satoshi
Yukihisa Wada
Satoshi Sano
Naoki Morimoto
Tokuda Satoshi
Yukihisa Wada
Satoshi Sano
Naoki Morimoto
Application Number:
JP2018149568A
Publication Date:
October 05, 2022
Filing Date:
August 08, 2018
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
G01N23/041; A61B6/00
Domestic Patent References:
| JP2016050891A | ||||
| JP2018099269A | ||||
| JP2014217397A | ||||
| JP2012065840A | ||||
| JP2008200359A |
Foreign References:
| WO2017141345A1 | ||||
| WO2014181478A1 | ||||
| US20140270070 |
Attorney, Agent or Firm:
Hirokazu Miyazono
Tomohiro Mimori
Tomohiro Mimori