Y-SHAPED TEM CELL

Japanese Patent JP3880727

B2

PROBLEM TO BE SOLVED: To obtain a Y-shaped TEM cell which can optimize utilization of a test space, by a method wherein three internal conductors are provided in a test region, the support base of an object to be tested is made rotatable and three N-type connectors in a coaxial connector joint region are connected, in a taper region, to both ends of the test region.
SOLUTION: N-type connectors 5 to 7 are connected to a body in a coaxial connector joint region 3 via a taper region 2 from a test region 1 in which an object to be tested is placed. The N-type connectors 5 to 7 are connected to respective left ends of a first internal conductor 11 to a third internal conductor 13 in the test region 1, and N-type connectors 8 to 10 are connected to their right ends. In addition, a gate is provided in the test region 1 in addition to a third outside conductor 16 in the center, and the state of the object to be tested is observed from a shielding window. The object to be tested is fixed to, and arranged on, a rotatable support base 4, and a support base 19 supports the body as a whole so as to be freely movable. The second internal conductor 12 and the third internal conductor 13 are installed near an upper wall and a lower wall inside the third outside conductor 16, also the first internal conductor 11 is installed near a wall, and a wide and uniform region is ensured. As a result, the utilization degree of a test space can be increased.

Youn Hoon
Zhao Guangseong

JP21333198A

February 14, 2007

July 28, 1998

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Electronics and Telecommunications Research Institute

G01R29/08; G01R29/10; G01R31/00; G01R33/42; (IPC1-7): G01R29/10; G01R29/08; G01R31/00

JP2203281A
JP8248087A
JP9196994A
JP245470U

Sanshin Iwao

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