Title:
HIGH TEMPERATURE TESTING DEVICE
Document Type and Number:
Japanese Patent JP2508560
Kind Code:
B2
Abstract:
PURPOSE: To obtain a high temperature testing device having prevented the failure of jigs during putting the jigs in and out of the testing chamber.
CONSTITUTION: A high temperature testing device has a jig containing chamber 20 where a plurality of testing jigs 13 set with test pieces are contained and a testing chamber 50 connected to the jig containing chamber 20 inside. After heating the testing chamber 50, a plurality of testing jigs 13 are put in and out of the testing chamber 50 in turn and continuous testing is conducted in the testing chamber 50. In the jig containing chamber, heaters HT are provided.
More Like This:
Inventors:
FUSE HISANORI
Application Number:
JP31692191A
Publication Date:
June 19, 1996
Filing Date:
November 29, 1991
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01N25/00; G01N3/18; (IPC1-7): G01N3/18
Domestic Patent References:
| JP61124847A |
Attorney, Agent or Firm:
Fuyuki Nagai