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Title:
走査顕微鏡で顕微プレパラートを検査するための装置
Document Type and Number:
Japanese Patent JP5046442
Kind Code:
B2
Abstract:
The arrangement for studying microscopic preparations with a scanning microscope consists of a laser (1) and an objective (12), which focuses the light produced by the laser (1) onto a sample (13) to be studied, an optical waveguide element (3), which transports the light produced by the laser (1), being provided between the laser (1) and the objective (12). The optical waveguide element is constructed from a plurality of micro-optical structure elements which have at least two different optical densities. It is particularly advantageous if the optical waveguide element (3) consists of photonic band gap material and is configured as an optical fiber.

Inventors:
Rafael Stolz
Johann Engelhard
Application Number:
JP2001183693A
Publication Date:
October 10, 2012
Filing Date:
June 18, 2001
Export Citation:
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Assignee:
Leica micro systems zms gb
International Classes:
G02B21/06; G02B6/122; G02B6/255; G02B21/00; G02B21/16; G02B27/00; G02B6/02; H01S3/00; H01S3/16
Domestic Patent References:
JP2188711A
JP2171712A
JP2002537574A
JP2002537575A
Foreign References:
US5903688
WO1999000685A1
Other References:
植田憲一,多光子顕微鏡用超短パルスレーザーの動向,レーザ研究,日本,1999年12月,第27巻第12号,805-811
J.C.Knight, J.Broeng, T.A.Birks, P.St.J.Russell,Photonic Band Gap Guidance in Optical Fibers,SCIENCE,1998年11月,VOL 282,1476-1478
Attorney, Agent or Firm:
Fujita Akira



 
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