An incidence light analysis device, an anti-dazzle control device, and an incidence light analyzing method

Title:

An incidence light analysis device, an anti-dazzle control device, and an incidence light analyzing method

Document Type and Number:

Japanese Patent JP5919110

Kind Code:

B2

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Inventors:

Takaya Kanaya

Application Number:

JP2012144258A

Publication Date:

May 18, 2016

Filing Date:

June 27, 2012

Export Citation:

Assignee:

Kyocera Corporation

International Classes:

B60J3/04

Domestic Patent References:

Attorney, Agent or Firm:

Kenji Sugimura
Akito Okura
Yuro Yoshizawa

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