A lamination state poor detection method and a Hirahanshi lamination state poor detection apparatus of Hirahanshi

Title:

A lamination state poor detection method and a Hirahanshi lamination state poor detection apparatus of Hirahanshi

Document Type and Number:

Japanese Patent JP5996965

Kind Code:

B2

Inventors:

Takayuki Ikeda
Junya Hasegawa
Toro Inagawa

Application Number:

JP2012179695A

Publication Date:

September 21, 2016

Filing Date:

August 14, 2012

Export Citation:

Assignee:

JFE Plant Engineering Co., Ltd.
Oji Holdings Co., Ltd.

International Classes:

G01B11/25; G01N21/88

Domestic Patent References:

Attorney, Agent or Firm:

Tetsuya Mori
Suzuki Isobe
Hide Tanaka Tetsu
Ichi Hirose
Toru Miyasaka
Megumi Konishi

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