Title:
TEST MEASUREMENT SYSTEM
Document Type and Number:
Japanese Patent JP2022165946
Kind Code:
A
Abstract:
To improve throughput of measurement.SOLUTION: A test measurement system 18 includes a machine learning system 36 which processes a waveform image output from a flash array digitizer (FAD) array 20 and associates the image with a set of tuning parameters of an optical transceiver. The FAD array 20 does not create a binary expression of the waveform. Instead, the FAD array increments a counter in the array expressing the voltage and position of the sample to create the waveform image. A system 18 may incorporate a standard A/D converter and a flash converter for high-speed waveform image capturing and standard YT (Y axis pair time) waveform acquiring.SELECTED DRAWING: Figure 2
Inventors:
PICKERD JOHN J
TAN KAN
HEIKE TRITSCHLER
EVAN DOUGLAS SMITH
WILLIAMS FABRICIO FLORES YEPEZ
TAN KAN
HEIKE TRITSCHLER
EVAN DOUGLAS SMITH
WILLIAMS FABRICIO FLORES YEPEZ
Application Number:
JP2022069631A
Publication Date:
November 01, 2022
Filing Date:
April 20, 2022
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R13/20
Attorney, Agent or Firm:
Hiroshi Arafune
Yoshio Arafune
Yoshio Arafune