ABNORMALITY DETECTING DEVICE FOR STORAGE ELEMENT, ABNORMALITY DETECTING METHOD FOR STORAGE ELEMENT, ABNORMALITY DETECTING PROGRAM FOR STORAGE ELEMENT, AND COMPUTER-READABLE RECORDING MEDIUM CONTAINING ABNORMALITY DETECTING PROGRAM FOR STORAGE ELEMENT IS RECORDED

Title:

Document Type and Number:

WIPO Patent Application WO/2008/053969

Kind Code:

A1

Abstract:

An abnormality detecting device for a storage element capable of increasing the precision of the abnormality detection of the storage element. The abnormality detecting device for the storage element comprises at least an equalization processing section, an abnormality judging section, a voltage measuring section, and a control unit. If capacity variations in storage element blocks B1, B2, …, and BN are produced, the control unit instructs an equalization processing to the equalization processing section. The abnormality judging section judges the abnormality of the storage element blocks B1, B2, …, and BN by using the voltage between the terminals of the respective storage element blocks B1, B2, …, and BN left untouched after a predetermined lapse of time from the moment when the equalization processing is completed.

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Inventors:

IIDA TAKUMA

Application Number:

PCT/JP2007/071338

Publication Date:

May 08, 2008

Filing Date:

November 01, 2007

Export Citation:

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Assignee:

MATSUSHITA ELECTRIC IND CO LTD (JP)
IIDA TAKUMA

International Classes:

H02J7/00; H01M10/44; H01M10/48; H02J7/02; H02J7/10

Foreign References:

JP2003282156A	2003-10-03
JP2006058285A	2006-03-02
JP2003282155A	2003-10-03
JP2003282156A	2003-10-03
JPH11178225A	1999-07-02
JP2003204627A	2003-07-18

Other References: