Title:
ABNORMALITY DETECTION DEVICE, POWER SUPPLY SYSTEM, AND ABNORMALITY DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/127335
Kind Code:
A1
Abstract:
An abnormality detection device according to one embodiment of the present technology is provided with a voltage retention unit, a feature quantity calculation unit, a dataset retention unit, and a degree-of-abnormality calculation unit. The voltage retention unit retains at least one voltage value from among a maximum value and a minimum value for each fixed time for measured voltage. The feature quantity calculation unit processes the voltage value retained by the voltage retention unit to calculate a feature quantity which is sensitive to a voltage spike waveform. The dataset retention unit retains a dataset obtained from a normal secondary cell. The degree-of-abnormality calculation unit uses the dataset read from the dataset retention unit to calculate the degree of abnormality of the feature quantity calculated by the feature quantity calculation unit.
Inventors:
SHIMURA JUSUKE (JP)
HAYASHI SAORI (JP)
HAYASHI SAORI (JP)
Application Number:
PCT/JP2022/042591
Publication Date:
July 06, 2023
Filing Date:
November 16, 2022
Export Citation:
Assignee:
MURATA MANUFACTURING CO (JP)
International Classes:
G01R31/00; G01R31/367; G01R31/52; H01M10/48; H02J7/00
Domestic Patent References:
WO2018131427A1 | 2018-07-19 | |||
WO2017150416A1 | 2017-09-08 | |||
WO2019138286A1 | 2019-07-18 | |||
WO2022004185A1 | 2022-01-06 |
Foreign References:
US20170259687A1 | 2017-09-14 | |||
JP2016519284A | 2016-06-30 | |||
JP2021034348A | 2021-03-01 |
Attorney, Agent or Firm:
TSUBASA PATENT PROFESSIONAL CORPORATION (JP)
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