ANOMALY DETECTING SYSTEM, ANOMALY DETECTING METHOD, AND PROGRAM

WIPO Patent Application WO/2020/166407

A1

This anomaly detecting system is provided with: a storage unit for storing a model to be controlled, n parameters in the model, parameter values when the model to be controlled is normal, and m types of parameter values when anomalous; a parameter value estimating unit which measures a control amount in a predetermined measurement period and estimates parameter values during measurement; and a diagnosing unit including a processing unit. The processing unit: in an n-dimensional parameter space, positions normal points corresponding to the parameter values when normal and m anomalous mode points respectively corresponding to the m types of parameter values when anomalous and associated with a cause of anomaly; positions measurement points corresponding to the parameter values during measurement; sets measurement vectors moving from the normal points to the measurement points, and respective anomalous mode point vectors moving from the normal points to the respective anomalous mode points; and evaluates the rate of contribution of the measurement vectors to the respective anomalous mode point vectors. The diagnosing unit diagnoses the degree of anomaly for each cause on the basis of the contribution rate.

TSUBATA HAJIME (JP)
TANAKA HITOSHI (JP)
YAMADA TAKAAKI (JP)

PCT/JP2020/003914

August 20, 2020

February 03, 2020

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OMRON TATEISI ELECTRONICS CO (JP)

G05B23/02; G05B13/02

JP2017057712A	2017-03-23
JP2017167663A	2017-09-21
US20160370258A1	2016-12-22

YAMAO, Norihito et al. (JP)

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