Title:
APPARATUS FOR MEASURING CONDITION OF OBJECT
Document Type and Number:
WIPO Patent Application WO/2015/088145
Kind Code:
A1
Abstract:
The present disclosure provides a measurement apparatus including a light source configured to output light toward a first side of an object, a sensor positioned relative to the light source to permit the object to be positioned between the light source and the sensor, wherein the sensor is configured to sense the light transmitted through the object, and an optical transmitter disposed at an upper portion of the sensor and comprising a plurality of optical fibers configured to transfer the transmitted light to the sensor.
Inventors:
HAN SUNGHO (KR)
HONG HEESUN (KR)
KANG MUNSEONG (KR)
LEE JAEHOON (KR)
HONG HEESUN (KR)
KANG MUNSEONG (KR)
LEE JAEHOON (KR)
Application Number:
PCT/KR2014/010850
Publication Date:
June 18, 2015
Filing Date:
November 12, 2014
Export Citation:
Assignee:
LG ELECTRONICS INC (KR)
International Classes:
A61B6/00; A61B5/06
Foreign References:
US20130289394A1 | 2013-10-31 | |||
US6293940B1 | 2001-09-25 | |||
US6413267B1 | 2002-07-02 | |||
US20120071740A1 | 2012-03-22 | |||
US20130059264A1 | 2013-03-07 |
Other References:
See also references of EP 3079590A4
None
None
Attorney, Agent or Firm:
PARK, Jang-Won (566, Gangnam-daero,Gangnam-gu, Seoul 135-814, KR)
Download PDF:
Previous Patent: CUTTING INSERT FOR INDEXABLE DRILL
Next Patent: CONDUCTIVE COMPOSITION FOR FORMING REAR ELECTRODE OF LIQUID CRYSTAL DISPLAY DEVICE
Next Patent: CONDUCTIVE COMPOSITION FOR FORMING REAR ELECTRODE OF LIQUID CRYSTAL DISPLAY DEVICE