Title:
BUILT-IN-SELF-TEST FOR DIGITAL TRANSMITTERS
Document Type and Number:
WIPO Patent Application WO2004093331
Kind Code:
A3
Abstract:
The present invention allows a complex digital processing engine to be tested automatically and autonomously using a minimum of memory and processing resources. In one embodiment, the invention includes an input buffer to store a digital test sequence, a digital data modulator coupled to the input buffer to generate a modulated digital sample sequence using the test sequence, a test buffer coupled to the modulator to receive and store a representation of the sample sequence, and a test buffer output to enable the test buffer contents to be compared to a reference sequence.
Inventors:
BHORA VEERENDRA (US)
BOROS TIBOR (US)
ROY PULAKESH (US)
BOROS TIBOR (US)
ROY PULAKESH (US)
Application Number:
PCT/US2004/009225
Publication Date:
February 03, 2005
Filing Date:
March 24, 2004
Export Citation:
Assignee:
ARRAYCOMM INC (US)
BHORA VEERENDRA (US)
BOROS TIBOR (US)
ROY PULAKESH (US)
BHORA VEERENDRA (US)
BOROS TIBOR (US)
ROY PULAKESH (US)
International Classes:
G01R31/317; H04L1/24; (IPC1-7): G01R31/28
Foreign References:
| US20040193985A1 | 2004-09-30 | |||
| US6038380A | 2000-03-14 | |||
| US6347387B1 | 2002-02-12 |
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