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Title:
CALIBRATION DEVICE, RAMAN SPECTROSCOPY MEASUREMENT DEVICE, AND WAVE NUMBER CALIBRATION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/085056
Kind Code:
A1
Abstract:
A spectroscopy measurement device according to the present embodiment comprises: a lamp light source (160) for generating lamp light having a plurality of emission lines; a plurality of inorganic materials; an objective lens (50) on which the lamp light and Raman scattered light from the plurality of inorganic materials impinge; a spectrometer (60) that spectrally detects the lamp light and the Raman scattered light from the objective lens (50); and a processing unit (70) that calculates a calibration wavelength axis of the spectrometer (60) on the basis of the wavelengths of the plurality of emission lines, calculates the incident wavelength of the laser light on the basis of the Raman bands of the Raman scattered light on the calibration wavelength axis, and converts the calibration wavelength axis to a wavenumber axis using the incident wavelength.

Inventors:
KUMAMOTO YASUAKI (JP)
FUJITA KATSUMASA (JP)
Application Number:
PCT/JP2023/036999
Publication Date:
April 25, 2024
Filing Date:
October 12, 2023
Export Citation:
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Assignee:
UNIV OSAKA (JP)
International Classes:
G01J3/02; G01J3/44; G01N21/65
Foreign References:
JPH07209179A1995-08-11
JPH07218441A1995-08-18
JPH0829336A1996-02-02
JPH0829412A1996-02-02
US20130162999A12013-06-27
JP2003524774A2003-08-19
JP2010008397A2010-01-14
CN114624221A2022-06-14
CN108169200A2018-06-15
CN116429260A2023-07-14
Other References:
GAKKAI SHUPPAN CENTER: "Chapter 3: Measurement method (4), Calibration and correction, Calibration for wavelength of standard material (a)", INTRODUCTION TO SPECTROSCOPIC MEASUREMENTS. SPECTROSCOPIC SOCIETY OF JAPAN. MEASUREMENT METHOD SERIES 13. 1ST EDITION, 10 February 1987 (1987-02-10), pages 141 - 143
"Manual for Micro-Raman Spectroscopy", 6 August 2017 (2017-08-06), pages 1 - 23, Retrieved from the Internet
GAKKAI SHUPPAN CENTER: "Raman Spectroscopy", SPECTROSCOPIC SOCIETY OF JAPAN MEASUREMENT METHOD SERIES 17. 1ST EDITION, 10 December 1988 (1988-12-10), pages 92 - 97
NANKODO CO., LTD.: "Laser-Raman spectroscopy and its applications", KAGAKU NO RYOIKI, no. extra issue 115, 20 March 1977 (1977-03-20), pages 13 - 21
Attorney, Agent or Firm:
IEIRI Takeshi (JP)
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