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Title:
CODE METRIC METHOD AND APPARATUS, DEVICE, AND MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/179578
Kind Code:
A1
Abstract:
The present invention provides a code metric method. The method comprises: obtaining metric indexes of a software code to be subjected to metrics, the metric indexes comprising metric indexes of at least two characteristic dimensions; respectively calculating scores of the characteristic dimensions according to first weights of the metric indexes in the characteristic dimensions and score values of the characteristic dimensions; and calculating a metric score according to the scores of the characteristic dimensions and second weights of the characteristic dimensions, the metric score being used for performing metric of the quality of said software code. According to embodiments of the present invention, architecture quality of a code level is quantified from multiple characteristic dimensions, the scores of the characteristic dimensions and the overall metric score of the code quality can be generated, the metric score can visually reflect the quality level and the decay degree of a current software architecture, and automatic identification is achieved on the software code quality, thereby facilitating related personnel knowing a development trend of a code architecture quality condition to control the quality of the code. The present invention further provides a code metric apparatus, a computer device, and a readable medium. FIG. 2

Inventors:
LIU YONG (CN)
YAN CHUNXIA (CN)
Application Number:
PCT/CN2023/082650
Publication Date:
September 28, 2023
Filing Date:
March 21, 2023
Export Citation:
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Assignee:
ZTE CORP (CN)
International Classes:
G06F11/36
Foreign References:
CN106919373A2017-07-04
CN111382052A2020-07-07
CN110580218A2019-12-17
CN111767212A2020-10-13
CN114065223A2022-02-18
Attorney, Agent or Firm:
TEE & HOWE INTELLECTUAL PROPER TY ATTORNEYS (CN)
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