Title:
DEVICE DIAGNOSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/047903
Kind Code:
A1
Abstract:
It is not possible to easily divide an analysis process according to torque or a speed change. Provided is a device diagnosis system characterized by comprising: a threshold value calculation unit that uses, as reference data, a portion of time-series data measured during operation of a device and that sets a plurality of threshold values for the reference data; a data dividing unit that divides, as statuses of respective ranges, the time-series data that meets conditions based on the plurality of threshold values; a feature amount calculation unit that calculates, from the time-series data in each status, a feature amount (summary statistics) thereof; an abnormality degree calculation unit that uses, as test data, another portion of the time-series data measured during operation of the device, and that analyzes and calculates an abnormality degree, which is the degree of an abnormality of the test data, for each status by applying the feature amount to the test data.
Inventors:
NAGATA KOUICHIROU (JP)
ABE SHIGEYUKI (JP)
MAEKAWA TATSUYA (JP)
ABE SHIGEYUKI (JP)
MAEKAWA TATSUYA (JP)
Application Number:
PCT/JP2022/032724
Publication Date:
March 30, 2023
Filing Date:
August 31, 2022
Export Citation:
Assignee:
HITACHI INDUSTRIAL PRODUCTS LTD (JP)
International Classes:
G01M99/00; G05B23/02
Domestic Patent References:
| WO2020188696A1 | 2020-09-24 |
Foreign References:
| JP2010137644A | 2010-06-24 | |||
| JP2020170327A | 2020-10-15 | |||
| CN112445842A | 2021-03-05 | |||
| JP2020135808A | 2020-08-31 |
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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