Title:
DISTANCE MEASURING DEVICE AND METHOD OF MEASURING DISTANCE
Document Type and Number:
WIPO Patent Application WO/2011/118255
Kind Code:
A1
Abstract:
Disclosed is a distance measuring device using an optical comb, such that the problems of insufficient amount of light and difficulty in extracting only necessary beats from numerous self beats with high signal to noise ratio (SNR) are solved. In order for the absolute distance to an object to be measured which has a surface with low reflection ratio or a scattering surface and is approximately 10 m apart, to be easily measured with accuracy of 0.1 mm or more using an optical and contactless method, the distance measuring device which measures the distance to the object to be measured is configured such that the distance to the object to be measured is measured by comparing the phase of the beat signal between a light source and a plurality of CW lasers which are reflected or scattered by the object with the phase of the beat signal between the light source and a plurality of CW lasers prior to being irradiated onto the object.
Inventors:
TACHIZAKI TAKEHIRO (JP)
WATANABE MASAHIRO (JP)
HARIYAMA TATSUO (JP)
YOSHITAKE YASUHIRO (JP)
MATSUI TETSUYA (JP)
MATSUMOTO HIROKAZU (JP)
TAKAMASU KIYOSHI (JP)
WATANABE MASAHIRO (JP)
HARIYAMA TATSUO (JP)
YOSHITAKE YASUHIRO (JP)
MATSUI TETSUYA (JP)
MATSUMOTO HIROKAZU (JP)
TAKAMASU KIYOSHI (JP)
Application Number:
PCT/JP2011/051812
Publication Date:
September 29, 2011
Filing Date:
January 28, 2011
Export Citation:
Assignee:
HITACHI LTD (JP)
TACHIZAKI TAKEHIRO (JP)
WATANABE MASAHIRO (JP)
HARIYAMA TATSUO (JP)
YOSHITAKE YASUHIRO (JP)
MATSUI TETSUYA (JP)
MATSUMOTO HIROKAZU (JP)
TAKAMASU KIYOSHI (JP)
TACHIZAKI TAKEHIRO (JP)
WATANABE MASAHIRO (JP)
HARIYAMA TATSUO (JP)
YOSHITAKE YASUHIRO (JP)
MATSUI TETSUYA (JP)
MATSUMOTO HIROKAZU (JP)
TAKAMASU KIYOSHI (JP)
International Classes:
G01S17/36
Foreign References:
| JPS61138191A | 1986-06-25 | |||
| JP2010038552A | 2010-02-18 | |||
| JP2004077979A | 2004-03-11 | |||
| JP2006184181A | 2006-07-13 | |||
| JP2008051674A | 2008-03-06 | |||
| JPH01503172A | 1989-10-26 |
Other References:
See also references of EP 2555015A4
TOYOHIKO YATAGAI: "Applied Optics Introductory Optical Measurement", APPLIED OPTICS INTRODUCTORY OPTICAL MEASUREMENT
K. MEINERS-HAGEN ET AL.: "Multi-Wavelength Interferometry for Length Measurements Using Diode Lasers", MEASUREMENT SCIENCE REVIEW, vol. 9, no. 1, 2009, pages 16
Y. SALVADE ET AL.: "High-accuracy absolute distance measurement using frequency comb referenced multiwavelength source", APPLIED OPTICS, vol. 47, no. 14, 2008, pages 2715
TOYOHIKO YATAGAI: "Applied Optics Introductory Optical Measurement", APPLIED OPTICS INTRODUCTORY OPTICAL MEASUREMENT
K. MEINERS-HAGEN ET AL.: "Multi-Wavelength Interferometry for Length Measurements Using Diode Lasers", MEASUREMENT SCIENCE REVIEW, vol. 9, no. 1, 2009, pages 16
Y. SALVADE ET AL.: "High-accuracy absolute distance measurement using frequency comb referenced multiwavelength source", APPLIED OPTICS, vol. 47, no. 14, 2008, pages 2715
Attorney, Agent or Firm:
POLAIRE I. P. C. (JP)
Polaire Intellectual Property Corporation (JP)
Polaire Intellectual Property Corporation (JP)
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Claims: