Title:
DUAL-CELL STRUCTURED OTP OR MTP MEMORY MODULE CAPABLE OF BLANK CHECKING
Document Type and Number:
WIPO Patent Application WO/2016/041406
Kind Code:
A2
Abstract:
A dual-cell structured OTP or MTP memory module capable of blank checking is provided. The module comprises a memory array, a sense amplifier, and a controller, and further comprises a data selector used for blank checking; in the memory array, two adjacent memory cells constitute a group and form a differential dual-cell structure, and the final output of said dual-cell structure upon passing through the sense amplifier is one bit; on the basis of a received blank-checking signal and a received cell-selection signal, the data selector selects the signal of a cell to input into the sense amplifier and said signal is compared to a reference signal; a signal larger than the reference signal yields a "1", and a signal smaller than the reference signal yields a "0"; the two cells are each blank-checked in this way; when not blank-checking, the signals of both of the two cells are inputted into the sense amplifier, compared one against the other, and then differentiated as a "1" and a "0". The advantage of the invention is: operating in differential dual-cell mode improves the reliability of the OTP or MTP memory module. In addition, with the use of blank checking the initial state of a chip would not be unknown prior to any writing done to said chip.
Inventors:
FANG GANG FENG (US)
Application Number:
PCT/CN2015/084037
Publication Date:
March 24, 2016
Filing Date:
July 15, 2015
Export Citation:
Assignee:
SUZHOU FENGCHI MICRO ELECTRONICS CO LTD (CN)
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