Title:
FAULT DIAGNOSIS DEVICE, FAULT DIAGNOSIS METHOD, FAULT DIAGNOSIS PROGRAM, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2020/136836
Kind Code:
A1
Abstract:
A fault diagnosis device equipped with: an acquisition unit for acquiring, from a system being diagnosed, data to be diagnosed that includes parameter values for a plurality of items; a storage unit for storing extraction source data that includes a plurality of data sets; an extraction unit for using the data being diagnosed and condition-setting information for determining an extraction condition, to determine an extraction condition, and extracting learning data from the extraction source data; a creation unit for creating, from the learning data, learning information for use in a pattern recognition method; and a diagnosis unit for determining whether the data being diagnosed is abnormal on the basis of the learning information. Each of the plurality of data sets includes parameter values for the plurality of items for a case in which the system being diagnosed is in a normal state. Among the plurality of data sets included in the extraction source data, the extraction unit extracts as the learning data a number of data sets up to an upper limit number, beginning from the top, when a group of data sets satisfying the extraction condition have been sorted using a predetermined standard.
Inventors:
MOTEGI YUSUKE (JP)
KAWANO YUKIHIRO (JP)
NAGASHIMA HITOMI (JP)
KUSAKABE TAKUMI (JP)
KAWANO YUKIHIRO (JP)
NAGASHIMA HITOMI (JP)
KUSAKABE TAKUMI (JP)
Application Number:
PCT/JP2018/048281
Publication Date:
July 02, 2020
Filing Date:
December 27, 2018
Export Citation:
Assignee:
IHI CORP (JP)
International Classes:
G05B23/02
Foreign References:
| JP2017102826A | 2017-06-08 | |||
| JP2016045808A | 2016-04-04 | |||
| JP2005092466A | 2005-04-07 |
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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