Title:
INSPECTION METHOD, PROGRAM, INSPECTION DEVICE, AND PRINTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/179742
Kind Code:
A1
Abstract:
Provided are an inspection method, program, inspection device, and printing device that enable uniform inspection during defect inspection of a printed article that uses a special substrate. The method includes: an image capture data acquisition step (S14) for acquiring image capture data (48) of a printed article that uses a special substrate; a print-free region positional information acquisition step (S16) for acquiring information (44) identifying the position of print-free regions in the image capture data corresponding to substrate regions of the printed article in which no designs or design backgrounds are printed; an inspection step (S20) for identifying print-free regions, applying a predefined inspection rule (46), and analyzing the image capture data to inspect the printed article; and a notification step (S22) for issuing notification of inspection results (50), and not issuing notification of inspection results indicating that defects are present in substrate regions of the printed article corresponding to print-free regions.
Inventors:
SEKI MASAKI (JP)
Application Number:
PCT/JP2020/008728
Publication Date:
September 10, 2020
Filing Date:
March 02, 2020
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G01N21/892; B41J29/393; G06T1/00
Foreign References:
| JP2018179699A | 2018-11-15 | |||
| JP2013255216A | 2013-12-19 | |||
| JP2007017214A | 2007-01-25 | |||
| JP2005205703A | 2005-08-04 | |||
| CN108267455A | 2018-07-10 |
Attorney, Agent or Firm:
MATSUURA, Kenzo (JP)
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