Title:
INTERFEROMETRIC FILTER WAVELENGTH METER AND CONTROLLER
Document Type and Number:
WIPO Patent Application WO2002059550
Kind Code:
A3
Abstract:
A wavelength measurement system uses birefringent material waveplate, thereby producing a substantially sinusoidal spectral response. As a result, the responses of multiple birefringent filters can be combined to yield a filter system with a periodic frequency response that has an additive wavelength resolution that is spectrally stable. That is, the wavelength measurement system (100) does not have regions where wavelength resolution is degraded. In one implementation, a waveplate system (112) is used, placed between two blocks of birefringent material (110) and (114). A quadrant detector (116) is used to detect the intensities of the resulting four beams.
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Inventors:
KUZNETSOV MARK E (US)
WHITNEY PETER S (US)
FLANDERS DALE C (US)
WHITNEY PETER S (US)
FLANDERS DALE C (US)
Application Number:
PCT/US2002/001815
Publication Date:
September 25, 2003
Filing Date:
January 22, 2002
Export Citation:
Assignee:
AXSUN TECH INC (US)
KUZNETSOV MARK E (US)
WHITNEY PETER S (US)
FLANDERS DALE C (US)
KUZNETSOV MARK E (US)
WHITNEY PETER S (US)
FLANDERS DALE C (US)
International Classes:
G01J9/02; H01S5/0687; H01S5/14; H01S5/06; (IPC1-7): G01J9/02; G02B27/28
Foreign References:
| EP0875743A1 | 1998-11-04 | |||
| US5841536A | 1998-11-24 |
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