Title:
KEY TESTING METHOD AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/011204
Kind Code:
A1
Abstract:
The present application provides a key testing method and system, the method comprising: according to a preset frequency, collecting a voltage value of a key to be tested between pressing and releasing, so as to obtain a voltage data set corresponding to the key to be tested; performing curve fitting on the voltage value and time in the voltage data set to obtain a first fitting curve; obtaining a time set the derivative of the first fitting curve of which is zero, and comparing the time set with a first preset set to obtain a first comparison result; on the basis of the first comparison result, obtaining a positive and negative derivative set of each element in the time set in a preset range, and comparing the positive and negative derivative set with a second preset set to obtain a second comparison result; and on the basis of the first comparison result and the second comparison result, determining current state information of the key to be tested. Using the foregoing of the present application can accurately test the current state of a key and improve the operation experience of a user.
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Inventors:
CHEN LEI (CN)
Application Number:
PCT/CN2022/107102
Publication Date:
February 09, 2023
Filing Date:
July 21, 2022
Export Citation:
Assignee:
GOERTEK INC (CN)
International Classes:
G01R31/327
Foreign References:
| CN113721139A | 2021-11-30 | |||
| CN101889394A | 2010-11-17 | |||
| CN1653411A | 2005-08-10 | |||
| CN109899584A | 2019-06-18 | |||
| JPH0830377A | 1996-02-02 |
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