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Patent Searching and Data


Title:
LENS MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/132930
Kind Code:
A1
Abstract:
Provided is a lens measurement device capable of rapidly and accurately obtaining the amount of misalignment between two front and back lens surfaces. A lens measurement device is provided with: a collimator lens (53) which makes light emitted from a light source unit (23) collimated light; a reference plate (33) which branches high coherent light (I) into light to be inspected (R2) and reference light (R1); a null mirror (38) which retroreflects the light to be inspected (R2); a rotation mechanism (37) which rotates the null mirror (38) around an optical axis (P0) by 180 degrees with respect to a lens to be inspected (10); an image capturing unit (24) which captures an image of interference fringes between the reference light (R1) and the light to be inspected (R2); an interference fringe analysis unit (44) which analyzes the interference fringes and calculates a wave front aberration caused by passing through the lens to be inspected (10); and a misalignment amount calculation unit (45) which, on the basis of the wave front aberration calculated when the null mirror (38) is located in a predetermined position and the wave front aberration calculated when the null mirror (38) is rotated by 180 degrees, calculates the misalignment between two front and back lens surfaces of the lens to be inspected (10).

Inventors:
GE ZONGTAO (JP)
SUN PING (JP)
IWAZAKI HIROYUKI (JP)
Application Number:
PCT/JP2012/056693
Publication Date:
October 04, 2012
Filing Date:
March 15, 2012
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
GE ZONGTAO (JP)
SUN PING (JP)
IWAZAKI HIROYUKI (JP)
International Classes:
G01M11/02; G01B11/00
Foreign References:
JP2009145081A2009-07-02
JPH0996589A1997-04-08
JP2007033343A2007-02-08
Attorney, Agent or Firm:
KOBAYASHI, KAZUNORI (JP)
Kazunori Kobayashi (JP)
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Claims: