MATERIAL TESTING APPARATUS AND MATERIAL TESTING METHOD USING SAME

WIPO Patent Application WO/2017/217604

A1

The present invention provides a material testing apparatus comprising: a testing part including a main frame, an actuator, and a load cell connected to the actuator; a jig part including an upper jig, which is connected to the testing part and clamps one side of the upper part of a nanomaterial specimen, and a lower jig, which is positioned at a lower part of the upper jig and clamps one side of a lower part of the nanomaterial specimen; a stage part connected to the lower jig so as to upwardly support the lower jig, and moving in the directions of multiple axes so as to move the lower jig in the directions of multiple axes; a first alignment part positioned to be spaced from the front surface of the nanomaterial specimen so as to enable a frontal alignment of the nanomaterial specimen to be checked; a second alignment part positioned to be spaced from the side surface of the nanomaterial specimen so as to enable a lateral alignment of the nanomaterial specimen to be checked by means of a side image of the nanomaterial specimen; and a control part. Therefore, mounting of even a nanoscale specimen is simple, and a compression test and a bending test, including a tension test, are enabled such that various material properties of a nano specimen can be measured.

JP2006242645

JIG FOR TESTING IN-PLANE SHEARING OF SHEETLIKE MATERIAL AND MACHINE FOR TESTING IN-PLANE SHEARING

KIM JU YOUNG (KR)
KIM YOUNG CHEON (KR)
KIM SI HOON (KR)

PCT/KR2016/011763

December 21, 2017

October 19, 2016

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UNIST(ULSAN NAT INSTITUTE OF SCIENCE AND TECHNOLOGY) (KR)

G01N3/04; G01N3/12; G01N3/20; G01N21/17

JP3131611U	2007-05-17
JP2004205248A	2004-07-22
JP2004069460A	2004-03-04
JPH08193931A	1996-07-30
US7681459B1	2010-03-23

JEON, Yong Joon (KR)

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