Title:
MEASUREMENT OF POINT CONTACT ANDREEV-REFLECTION CHARACTERISTICS OF HALF-METALLIC THIN FILMS
Document Type and Number:
WIPO Patent Application WO2004079340
Kind Code:
A3
Abstract:
An apparatus for measuring spin polarization via Point Contact Andreev Reflection (PCAR) at a magnet-superconductor junction, with variable magnetic fields and temperature control. A cryostat probe investigates superconducting energy gap and Andreev reflection in superconductor-half metal junctions, in a wide range of magnetic fields and temperature form 2K-300K. The cryostat probe is integrated with a commercial physical properties measurement system. The measurement probe includes a rotary-translation stage with coarse and fine screws the tenable a user to make point contacts in a cryogenic, evacuated environment where the point contact junction can be controlled at room temperature by turning a knob. Copper wires are connected as electrical leads from an aluminum housing, descend down to a copper housing for measurement, when contact is made by tip with a half-metal sample, such as CrO2: External current and voltage meters measure the current-voltage characteristics and data acquisition is performed using computer interface.
More Like This:
Inventors:
HARIHARAN SRIKANTH (US)
SANDERS JEFF T (US)
SANDERS JEFF T (US)
Application Number:
PCT/US2004/006219
Publication Date:
December 02, 2004
Filing Date:
March 01, 2004
Export Citation:
Assignee:
UNIV SOUTH FLORIDA (US)
HARIHARAN SRIKANTH (US)
SANDERS JEFF T (US)
HARIHARAN SRIKANTH (US)
SANDERS JEFF T (US)
International Classes:
G01R33/12; (IPC1-7): G01N31/02
Foreign References:
| US6017590A | 2000-01-25 | |||
| US5621210A | 1997-04-15 | |||
| US5585736A | 1996-12-17 | |||
| US6344659B1 | 2002-02-05 | |||
| US6646250B2 | 2003-11-11 |
Other References:
OSOFSKY M.S.: "Measurement of the spin polarization of LaSrMnO", J. OF APPLIED PHYSICS, vol. 85, no. 8, 15 April 1999 (1999-04-15), pages 5567 - 5569, XP012047511
STRIJKER G.J.: "Determination of spin polarization of half-metallic CrO2 by point contact andreev reflection", PHYSICAL REVIEW LETTERS, vol. 86, no. 24, 11 June 2001 (2001-06-11), pages 5585 - 5588, XP002982388
XIA K.: "Spin-dependent transparency of ferromagnet/superconductor interfaces", PHYSICAL REVIEW LETTERS, vol. 89, no. 16, 14 October 2002 (2002-10-14), pages 166603-1 - 166603-4, XP002982389
SZABO P.: "Andreev-reflection study in MgB2", SUPERCOND. SCI. TECHNOL., February 2003 (2003-02-01), pages 162 - 166, XP002982390
STRIJKER G.J.: "Determination of spin polarization of half-metallic CrO2 by point contact andreev reflection", PHYSICAL REVIEW LETTERS, vol. 86, no. 24, 11 June 2001 (2001-06-11), pages 5585 - 5588, XP002982388
XIA K.: "Spin-dependent transparency of ferromagnet/superconductor interfaces", PHYSICAL REVIEW LETTERS, vol. 89, no. 16, 14 October 2002 (2002-10-14), pages 166603-1 - 166603-4, XP002982389
SZABO P.: "Andreev-reflection study in MgB2", SUPERCOND. SCI. TECHNOL., February 2003 (2003-02-01), pages 162 - 166, XP002982390
Download PDF:
Previous Patent: TARGET LIGAND GENERATION
Next Patent: APPARATUS AND METHODS FOR PREDICTING PROPERTIES OF PROCESSED MATERIAL
Next Patent: APPARATUS AND METHODS FOR PREDICTING PROPERTIES OF PROCESSED MATERIAL