METHOD AND APPARATUS FOR MEASURING MATERIAL PROPERTIES AND LIFT-OFF COMPONENTS OF AN OBJECT USING A MAGNETIC PROBE

Title:

METHOD AND APPARATUS FOR MEASURING MATERIAL PROPERTIES AND LIFT-OFF COMPONENTS OF AN OBJECT USING A MAGNETIC PROBE

Document Type and Number:

WIPO Patent Application WO2003034054

Kind Code:

A3

Abstract:

Method and apparatus for measuring material properties such as stress in a ferromagnetic material using an electromagnetic probe. While generating an alternating magnetic field in the object, and sensing the resulting magnetic field with a sensor, the signals from the magnetic sensor may be resolved into in-phase and guadrature components. The signals are affected by both geomaterical parameters such as lift-off any by material properties, but these influences may be separated by mapping the in-phase and quadrature components directly into material property and lift-off components, and hence a material property and/or the lift-off may be determined. The mapping may be represented in the impedance plane as two sets of contours representing signal variation with lift-off (A) (for different values of stress) and signal variation with stress (B) (for different values of lift-off), the contours of both sets (A, B) being curved. The stress contours (B) at a constant angle. Hence calibration measurements taken along a few contours of each set enable the positions of the other contours of each set to be determined.

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Inventors:

BUTTLE DAVID JOHN (GB)

Application Number:

PCT/GB2002/004531

Publication Date:

September 12, 2003

Filing Date:

October 07, 2002

Export Citation:

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Assignee:

AEA TECHNOLOGY PLC (GB)
BUTTLE DAVID JOHN (GB)

International Classes:

G01N3/32; G01N19/08; G01N27/72; G01N27/90; G01R33/12; G01N3/00; G01N3/02; G01N3/06; (IPC1-7): G01N27/90; G01N27/83

Foreign References:

EP0631147A1	1994-12-28
US5541510A	1996-07-30
US5341678A	1994-08-30
US3358225A	1967-12-12
US6188218B1	2001-02-13
US5963031A	1999-10-05
US4727322A	1988-02-23
US5828211A	1998-10-27
EP0282930A2	1988-09-21

Other References:

PATENT ABSTRACTS OF JAPAN vol. 013, no. 149 (P - 855) 12 April 1989 (1989-04-12)

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