Title:
METHOD AND APPARATUS FOR MEASURING SOURCE FOLLOWER GAIN IN AN IMAGE SENSOR ARRAY
Document Type and Number:
WIPO Patent Application WO2008089026
Kind Code:
B1
Abstract:
Disclosed embodiments provide a method and apparatus for measuring the gain of output transistors of pixels in an imager device. Source/drain terminals of the output transistor and a reset transistor are driven with various input voltages to generate pixel output voltages. The slope of a line representing the relationship between the output voltages and the input voltages is determined. A component of the slope corresponding to gain not caused by the output transistor is removed from the slope to determine the gain of the output transistor.
Inventors:
LI XIANGLI (US)
Application Number:
PCT/US2008/050713
Publication Date:
December 11, 2008
Filing Date:
January 10, 2008
Export Citation:
Assignee:
MICRON TECHNOLOGY INC (US)
LI XIANGLI (US)
LI XIANGLI (US)
International Classes:
H01L27/146; H04N5/341; H04N5/374; H04N5/378; H04N17/00
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