METHOD FOR ESTIMATING THE CRITICAL CURRENT DENSITY OF A SUPERCONDUCTING WIRE USING AN ESTIMATION OF MAGNETIZATION LOSS

Title:

METHOD FOR ESTIMATING THE CRITICAL CURRENT DENSITY OF A SUPERCONDUCTING WIRE USING AN ESTIMATION OF MAGNETIZATION LOSS

Document Type and Number:

WIPO Patent Application WO/2011/062350

Kind Code:

A1

Abstract:

The present invention relates to a method for estimating the critical current density of a superconducting wire using an estimation of magnetization loss, wherein the method comprises the following steps: (a) applying a magnetic field from an external source to the superconducting wire; (b) measuring the magnetization loss of the superconducting wire caused by the application of the magnetic field from an external source; (c) normalizing the measured magnetization loss, and calculating the completely permeated magnetic field of the superconducting wire on the basis of the normalized magnetization loss; and (d) calculating a critical current density of the superconducting wire on the basis of the completely permeated magnetic field calculated in the previous step. Accordingly, critical current densities of parallel-type superconducting wires such as stacked type superconducting wires can be measured when current is not directly applied to the superconducting wires.

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Inventors:

CHOI KYEONG DAL (KR)
LEE JI KWANG (KR)
KIM WOO SEOK (KR)
PARK CHAN (KR)
HAN BYUNG WOOK (KR)
LEE SE YEON (KR)

Application Number:

PCT/KR2010/004957

Publication Date:

May 26, 2011

Filing Date:

July 28, 2010

Export Citation:

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Assignee:

KOREA POLYTECH UNIV IND ACAD (KR)
WOOSUK UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION (KR)
CHOI KYEONG DAL (KR)
LEE JI KWANG (KR)
KIM WOO SEOK (KR)
PARK CHAN (KR)
HAN BYUNG WOOK (KR)
LEE SE YEON (KR)

International Classes:

G01R19/08; G01N27/00

Foreign References:

JP2005257592A	2005-09-22
JP2003207526A	2003-07-25
JP2007078500A	2007-03-29

Attorney, Agent or Firm:

NAMCHON INTERNATIONAL PATENT AND LAW FIRM (KR)
특허법인 남촌 (KR)

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