Title:
METHOD FOR INSPECTING GLASS SUBSTRATE FOR FLAT PANEL DISPLAY, AND GLASS SUBSTRATE FOR FLAT PANEL DISPLAY
Document Type and Number:
WIPO Patent Application WO/2012/093633
Kind Code:
A1
Abstract:
The purpose of the present invention is to perceive image-distorting defects in a display arising from portions of a glass substrate for a flat panel display which have optical distortions. In the inspection method of the present invention, image data of a glass substrate for a flat panel display are created which reflect portions of the glass substrate having optical distortions, by passing light from a light source through the glass substrate in a state in which some of the light from the light source along the optical path from the light source to the imaging means is blocked by a light-blocking plate, and capturing an image through use of an imaging means. When the maximum length A in portions of the image data having optical distortions is three times the maximum length of a sub-pixel of the flat panel display or less, the glass substrate is judged to be good. In all other cases, the glass substrate is judged to be defective.
Inventors:
HOKAMA KISHUN (JP)
YOSHINO KEIICHI (JP)
ETA MICHIHARU (JP)
YOSHINO KEIICHI (JP)
ETA MICHIHARU (JP)
Application Number:
PCT/JP2011/080394
Publication Date:
July 12, 2012
Filing Date:
December 28, 2011
Export Citation:
Assignee:
NIPPON ELECTRIC GLASS CO (JP)
HOKAMA KISHUN (JP)
YOSHINO KEIICHI (JP)
ETA MICHIHARU (JP)
HOKAMA KISHUN (JP)
YOSHINO KEIICHI (JP)
ETA MICHIHARU (JP)
International Classes:
G01N21/958
Domestic Patent References:
| WO2010024082A1 | 2010-03-04 | |||
| WO2010146732A1 | 2010-12-23 | |||
| WO2007145223A1 | 2007-12-21 |
Foreign References:
| JP2008096302A | 2008-04-24 | |||
| JP2005265503A | 2005-09-29 |
Attorney, Agent or Firm:
SHIROMURA Kunihiko et al. (JP)
Kunihiko Shiromura (JP)
Kunihiko Shiromura (JP)
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Claims: