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Patent Searching and Data


Title:
METHOD FOR PRODUCING TRANSISTOR
Document Type and Number:
WIPO Patent Application WO/2012/023387
Kind Code:
A1
Abstract:
Provided is a method for producing, at a good yield, a high-precision, high-quality transistor by selectively etching a dummy gate formed from a natural silicon oxide film and, in addition, silicon. The method for producing the transistor is characterized by using a structure that comprises: a dummy gate laminate formed by laminating, on a substrate, at least a high dielectric material film and a dummy gate which is formed from silicon and has a natural silicon oxide film on the surface of the dielectric material film; side walls disposed so as to cover the side surfaces of the laminate; and an interlayer insulation film disposed so as to cover the side walls, is characterized by having an etching step that uses a predetermined etching solution, and is characterized by substituting the dummy gate with an aluminum metal gate.

Inventors:
SHIMADA KENJI (JP)
MATSUNAGA HIROSHI (JP)
ABE KOJIRO (JP)
YAMADA KENJI (JP)
Application Number:
PCT/JP2011/066996
Publication Date:
February 23, 2012
Filing Date:
July 26, 2011
Export Citation:
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Assignee:
MITSUBISHI GAS CHEMICAL CO (JP)
SHIMADA KENJI (JP)
MATSUNAGA HIROSHI (JP)
ABE KOJIRO (JP)
YAMADA KENJI (JP)
International Classes:
H01L21/306; H01L21/28; H01L21/308; H01L21/336; H01L21/8234; H01L27/088; H01L29/423; H01L29/49; H01L29/78
Foreign References:
JP2009152342A2009-07-09
JP2004221226A2004-08-05
JPH09252114A1997-09-22
JP2004502980A2004-01-29
JP2007214456A2007-08-23
JP2002359369A2002-12-13
JP2008047898A2008-02-28
JPH10189722A1998-07-21
US7316949B22008-01-08
JP2004152862A2004-05-27
JPH0917766A1997-01-17
JP2004087960A2004-03-18
JPH03219625A1991-09-27
JPH04370932A1992-12-24
JP2007214456A2007-08-23
JPH0448633A1992-02-18
JP2005229053A2005-08-25
JP2006008932A2006-01-12
Other References:
APPLIED PHYSICS, vol. 76, no. 9, 2007, pages 1006
COMPLETE COLLECTION OF MICRO-MACHINE/MEMS TECHNOLOGIES, 2003, pages 111
Attorney, Agent or Firm:
OHTANI, Tamotsu et al. (JP)
Tamotsu Otani (JP)
Download PDF:
Claims: